A thiophenopolyamine Cu(II) complex fixed by atmospheric carbon dioxide: Synthesis, structure and properties

Journal of Coordination Chemistry

Volumn 61, Issue 12, 2008, Pages 1973-1982

  Hu, Dan ^a   Chen, Lei ^a   Pan, Zhi Quan ^a   Liu, Huan ^a   Meng, Xiang Gao ^b   Song, You ^c  

^a WUHAN INSTITUTE OF TECHNOLOGY   (China)

^b CENTRAL CHINA NORMAL UNIVERSITY   (China)

^c NANJING UNIVERSITY   (China)

Author keywords

Copper complexes; Magnetic properties; Polyamines; Trimetallic complexes

Indexed keywords

EID: 45849117976     PISSN: 00958972     EISSN: 10290389     Source Type: Journal    
DOI: 10.1080/00958970701795706     Document Type: Article

References (29)

1. W. Leitner. Coord. Chem. Rev., 153, 257 (1996);
2. X.L. Yin, J.R. Moss. Coord. Chem. Rev., 181, 27 (1999);
3. D.A. Palmer, R. van Eldik. Chem. Rev., 83, 651 (1983);
4. D.B. Dell'Amico, F. Calderazzo, L. Labella, F. Marchetti, G. Pampaloni. Chem. Rev., 103, 3857 (2003).
5. W. Huang, P.-Y. Sun, J.-L. Fang, Y.-F. Sun, S.-H. Gou. Trans. Met. Chem., 28, 925 (2003).
6. A. Escuer, R. Vicente, S.B. Kumar. Inorg. Chem., 35, 3094 (1996).
7. J. Sletten, H. Hope, M. Julve, O. Kahn, M. Verdaguer, A. Dworkin. Inorg. Chem., 27, 542 (1988);
8. Z. Tyeclar, P.P. Partha, R. Jacobson, A. Farooq, K.D. Karlin, J. Zubieta. J. Am. Chem. Soc., 111, 388 (1989).
9. G. Kilks, S.J. Lippard, J.V. Waszczak. J. Am. Chem. Soc., 102, 4832 (1980).
10. F.W.B. Einstein, A.C. Willis. Inorg. Chem., 20, 609 (1981);
11. R. Albare, J.L. Atwood, E. Carmona, P.J. Perez, M.L. Poveda, R.D. Rogers. Inorg. Chem., 30, 1493 (1991).
12. J. Sletten. Acta Chem. Scand., Ser. A, 38, 491 (1984);
13. D.Y. Jeter, D.J. Hodgson, W.E. Hatfield. Inorg. Chem., 11, 185 (1972).
14. P.C. Healy, A.H. White. J. Chem. Soc., 1913 (1972);
15. P.D. Brotherton, A.H. White. J. Chem. Soc., 2338 (1972);
16. A.K. Gregson, P.C. Healy. Inorg. Chem., 17, 2969 (1978).
17. A.N. Acharya, A. Das, A.C. Dash. Adv. Inorg. Chem., 55, 127 (2004);
18. Z.W. Mao, G. Liehr, R. van Eldik. J. Am. Chem. Soc., 122, 4839 (2000);
19. J.C. Kim, J.H. Cho, H. Kim, A.J. Lough. Chem. Commun., 1796 (2004);
20. D.S. Marlin, M.M. Olmstead, P.K. Mascharak. Inorg. Chem., 43, 1681 (2004).
21. L.-Y. Kong, Z.-H. Zhang, H.-F. Zhu, H. Kawaguchi, T. Okamura, M. Doi, Q. Chu, W.-Y. Sun, N. Ueyama. Angew. Chem. Int. Ed., 44, 4352 (2005).
22. Smart, and Saint. Area Detector Control and Integration Software, Siemens Analytical X-Ray Systems, Inc., Madison, Wisconsin, USA (1996).
23. G.M. Sheldrick. SHELXTL V5.1 Software Reference Manual, Bruker AXS, Inc., Madison, Wisconsin, USA (1997).
24. C. Bazzicalupi, A. Bencini, A. Bianchi, V. Fusi, C. Giorgi, P. Paoli, P. Paoletti, B. Valtancoli, C. Zanchini. Inorg. Chem., 35, 5540 (1996).
25. A. Escuer, R. Vicente, E. Penalba, X. Solans, M.F. Bardia. Inorg. Chem., 35, 248 (1996).
26. V. Mckee, S.S. Tandon. Inorg. Chem., 28, 2901 (1989).
27. G. Kolks, S.J. Lippard, J.V. Waszczak. J. Am. Chem. Soc., 102, 4832 (1980);
28. C. Bazzicalupi, A. Escuer, R. Vicente, S.B. Kumar, X. Solans, M. Font-Bardia. J. Chem. Soc., Dalton Trans., 403 (1997);
29. G.A. Vanalbada, I. Mutikainen, O.S. Roubeau, U. Turpeinen, J. Reedijk. Eur. J. Inorg. Chem., 2000, 2179 (2000).