Electrical characterization of DNA in mechanically controlled break-junctions

New Journal of Physics

Volumn 10, Issue , 2008, Pages

  Kang, N ^a,b   Erbe, A ^a   Scheer, E ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DNA; GENES; METALLIZING; MOLECULES; ORGANIC ACIDS;

BREAK-JUNCTIONS; CONDUCTION PROCESSES; DNA MOLECULES; ELECTRICAL CHARACTERIZATIONS; ELECTRODE DISTANCES;

NUCLEIC ACIDS;

EID: 45849096007     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/10/2/023030     Document Type: Article

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