Thickness and low-temperature conductivity of DNA molecules

Applied Physics Letters

Volumn 84, Issue 6, 2004, Pages 1007-1009

  Kasumov, A Yu ^a,b,c   Klinov, D V ^d   Roche, P E ^a,e   Gueron S ^a   Bouchiat, H ^a  

^a UNIVERSITÉ PARIS SUD   (France)

^b RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^c RIKEN   (Japan)

^d SHEMYAKIN OVCHINNIKOV INSTITUTE OF BIOORGANIC CHEMISTRY   (Russian Federation)

^e LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DNA; INSULATING MATERIALS; SCANNING TUNNELING MICROSCOPY; THERMAL CONDUCTIVITY; THERMAL EFFECTS; THICKNESS MEASUREMENT; TRANSPORT PROPERTIES;

INSULATING BEHAVIOR; OHMIC BEHAVIOR; SPREADING RESISTANCE MODES;

MOLECULAR DYNAMICS;

EID: 1542349077     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1644909     Document Type: Article

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