Atomic resolution analyses of nano-structured materials by atom probe tomography

International Journal of Nanotechnology

Volumn 5, Issue 6-8, 2008, Pages 592-608

  Pareige, P ^a,c,d   Cadel, E ^a,c   Sauvage, X ^a   Deconihout, B ^a   Blavette, D ^a,e   Mangelinck, D ^b  

^a UNIVERSITÉ DE ROUEN   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c Université de Rouen

^d GPM UMR CNRS 6634 ^*

^e National Research Group (GDR)

Author keywords

Atom probe; Instrumentation; Microelectronic; Nanoanalyses; Nanomaterials; ODS steels; Severe plastic deformation

Indexed keywords

ATOMS; IRON ALLOYS; LASER PULSES; MICROELECTRONICS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; PLASTIC DEFORMATION; PROBES;

ATOM PROBE; INSTRUMENTATION; NANOANALYSES; ODS STEELS; SEVERE PLASTIC DEFORMATIONS;

ATOM LASERS;

EID: 45849085381     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2008.018684     Document Type: Article

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