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Volumn 462, Issue 1-2, 2008, Pages 452-455

Ion irradiation-induced modifications in the surface morphology of Ge20Se74Bi6 thin films

Author keywords

Atomic force microscopy; Chalcogenide; Ion irradiation; Surface morphology; Thin films

Indexed keywords

CHARGED PARTICLES; ELECTRONS; GEOPHYSICAL PROSPECTING; GERMANIUM; MORPHOLOGY; SURFACE MORPHOLOGY; SURFACES;

EID: 45749150706     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2007.09.058     Document Type: Article
Times cited : (11)

References (17)
  • 4
    • 0036534935 scopus 로고    scopus 로고
    • Nordlund K. NIMB 188 (2002) 41-48
    • (2002) NIMB , vol.188 , pp. 41-48
    • Nordlund, K.1
  • 15
    • 0030283463 scopus 로고    scopus 로고
    • Mehta G.K. NIMA 382 (1996) 335
    • (1996) NIMA , vol.382 , pp. 335
    • Mehta, G.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.