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Volumn 462, Issue 1-2, 2008, Pages 452-455
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Ion irradiation-induced modifications in the surface morphology of Ge20Se74Bi6 thin films
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Author keywords
Atomic force microscopy; Chalcogenide; Ion irradiation; Surface morphology; Thin films
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Indexed keywords
CHARGED PARTICLES;
ELECTRONS;
GEOPHYSICAL PROSPECTING;
GERMANIUM;
MORPHOLOGY;
SURFACE MORPHOLOGY;
SURFACES;
(1 1 0) SURFACE;
ION IRRADIATIONS;
SWIFT HEAVY ION (SHI);
IONS;
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EID: 45749150706
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2007.09.058 Document Type: Article |
Times cited : (11)
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References (17)
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