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Thin Solid Films

Volumn 406, Issue 1-2, 2002, Pages 190-194

Atomic force microscopy study of the morphological shape of thin film buckling

(1) Coupeau, C a

a UNIVERSITÉ DE POITIERS (France)

Author keywords

Atomic force microscopy; Buckling patterns; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUCKLING; COMPRESSIVE STRESS; DELAMINATION; MORPHOLOGY; SPUTTERING; STRESS ANALYSIS;

INTERNAL STRESSES;

THIN FILMS;

EID: 0037051238 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01772-2 Document Type: Article

Times cited : (48)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.