Validating fault tolerant designs using Laser Fault Injection (LFI)

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1997, Pages 175-183

  Samson, John R ^a   Moreno, Wilfrido ^a   Falquez, Fernando ^a  

^a HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR DETECTION; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT TESTING; MULTIPLYING CIRCUITS; OSCILLATORS (ELECTRONIC); REDUCED INSTRUCTION SET COMPUTING; SEMICONDUCTOR DEVICE STRUCTURES; VLSI CIRCUITS;

LASER FAULT INJECTION (LFI);

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0031353224     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/dftvs.1997.628323     Document Type: Conference Paper

References (24)