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Applied Physics Letters

Volumn 92, Issue 24, 2008, Pages

Measurement of ultralow injection current to polymethyl-methacrylate film

(3) Yan, Feng a Hong, Yi b Chan, Helen L W a

a HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

b PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADMINISTRATIVE DATA PROCESSING; ELECTRIC POTENTIAL; INJECTION (OIL WELLS); MANAGEMENT INFORMATION SYSTEMS; MEASUREMENTS; METAL INSULATOR BOUNDARIES; METALLIZING; SEMICONDUCTOR JUNCTIONS; SWITCHING CIRCUITS; THICK FILMS; THIN FILM DEVICES; THIN FILM TRANSISTORS; THIN FILMS; TRANSISTORS;

(PL) PROPERTIES; AMERICAN INSTITUTE OF PHYSICS (AIP); CRITICAL ISSUES; DIPOLE RELAXATION; FLAT BAND VOLTAGE (VFB); GATE INSULATORS; HOLE INJECTION CURRENTS; INJECTION CURRENTS; METAL-INSULATOR-SEMICONDUCTOR (MIS); METHACRYLATE (APMA); ORGANIC THIN FILM TRANSISTORS (O TFT); PMMA FILMS; RICHARDSON-SCHOTTKY (R-S) EQUATION; SPACE CHARGES;

MIS DEVICES;

EID: 45749117193 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2948853 Document Type: Article

Times cited : (10)

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