|
Volumn 23, Issue 3, 2008, Pages 562-566
|
Superhardness effect and high temperature oxidation resistance of AlN/SiO2 nano-multilayers
|
Author keywords
AlN SiO2 multilayer; Epitaxial growth; Oxidation resistance; Superhardness effect
|
Indexed keywords
ALUMINUM COMPOUNDS;
ANNEALING;
EPITAXIAL GROWTH;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MAGNETRON SPUTTERING;
MECHANICAL PROPERTIES;
MICROSTRUCTURE;
NANOINDENTATION;
NANOSTRUCTURED MATERIALS;
OXIDATION RESISTANCE;
SCANNING ELECTRON MICROSCOPY;
SILICA;
THERMOOXIDATION;
X RAY DIFFRACTION ANALYSIS;
ALUMINUM NITRIDE/SILICA MULTILAYER;
REACTIVE MAGNETRON SPUTTERING;
SUPERHARDNESS EFFECT;
MULTILAYER FILMS;
|
EID: 45449093817
PISSN: 1000324X
EISSN: None
Source Type: Journal
DOI: 10.3724/SP.J.1077.2008.00562 Document Type: Article |
Times cited : (1)
|
References (13)
|