Measurements of loss tangent and relative permittivity of LTCC ceramics at varying temperatures and frequencies

Journal of the European Ceramic Society

Volumn 23, Issue 14, 2003, Pages 2611-2615

  Mazierska, Janina ^a   Jacob, Mohan V ^a   Harring, Andrew ^a   Krupka, Jerzy ^b   Barnwell, Peter ^c   Sims, Theresa ^c  

^a JAMES COOK UNIVERSITY   (Australia)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^c Heraeus Circuit Materials Division   (United States)

Author keywords

Dielectric properties; LTCC; Measurement system; Substrates

Indexed keywords

FREQUENCIES; MICROWAVES; PERMITTIVITY;

DIELECTRIC RESONATORS;

CERAMIC MATERIALS;

CERAMICS; MICROWAVE RADIATION;

EID: 0041689549     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00182-1     Document Type: Article

References (16)

1. Mandai H., Wakino K. and Nakajima N. Recent development on materials for multiplayer ceramic microwave devices, APMC2001 SMMM, 2001, Taipei, Taiwan, 142-145.
2. Valant M., Glass-free materials for LTCCC technology, 2001, APMC2001 SMMM, 2001,Taipei, Taiwan, 6-11.
3. Barnwell P., Free C., and Tian Z. Low temperature co-fired ceramics (LTCC) and thick film technologies for microwave applications to 70GHz, 2001, APMC2001 SMMM, 2001,Taipei, Taiwan, 1-4.
4. Barnwell P., Free C., Chen L., Aitchison C. A Novel thick film on ceramic microwave technology, APMC'98, 1998, Yokohama, Japan, 495-498.
5. DelaBalle J. Guillon P. Garault Y. Local complex per-mittivity measurements of MIC substrates AEU Electronics and Communication 35 1981 80-83
6. 01? mode dielectric resonator for the complex permittivity measurements of semiconductors CPEM ' 86 1986 154-155
7. Nishikawa T. et al. Precise measurement method for complex permittivity of microwave substrate CPEM ' 88 1988 154-155
8. Krupka, J., Geyer, R. G., Baker-Jarvis, J. and Ceremuga, J., Measurements of the complex permittivity of microwave circuit board substrates using split dielectric resonator and reentrant cavity techniques. In DMMA96 Conference, 1996, Bath, UK, pp. 21-24.
9. Krupka, J., Gregory, A. P., Rochard, O. C. and Clarke, R. N., Le split resonator et d'autres techniques de mesures. In Int. Conf. 6-emes Journees de Caracterisation Micro-ondes et Materiaux (JCMM'2000), 2000, Paris..
10. Krupka, J., Clarke, R. N., Rochard, O. C. and Gregory, A. P., Split Post Dielectric Resonator technique for precise measurements of laminar dielectric specimens-measurement uncertainties. In XIII Int. Conference MIKON'2000, 2000, Wroclaw, Poland, pp. 305-308.
11. Krupka J. Gabelich S.A. Derzakowski K. Pierce B.M. Comparison of split post dielectric resonator and ferrite disc resonator techniques for microwave permittivity measurements of polycrystalline yttrium iron garnet Meas. Sci. Technol. 10 1999 1004-1008
12. Krupka J. Gregory A.P. Rochard O.C. Clarke R.N. Riddle B. Baker-Jarvis J. Uncertainty of complex permittivity measurements by split post dielectric resonator technique J Europ. Ceram. Soc. 21 2001 2673-2676
13. Krupka J., software REZ30.
14. Krupka J., software REZ337.
15. Leong K., Precise measurements of surface resistance of HTS thin films using a novel method of Q-factor computations for Sapphire Dielectric resonators in the transmission mode. PhD thesis, 2000 James Cook University.
16. Leong K., Mazierska J., Precise measurements of the Q-factor of transmission mode dielectric resonators: accounting for noise, crosstalk, coupling loss and reactance, and uncalibrated transmission lines. In IEEE Tran. Microwave Theory and Techniques, 2002, vol. 50(9), 2115-2127.