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Journal of Crystal Growth

Volumn 270, Issue 3-4, 2004, Pages 309-315

Structural characterization of CdTe layers grown on (0 0 0 1) sapphire by MOCVD

(3) Zuniga Perez J a Tena Zaera, R a Munoz Sanjose V a

a UNIVERSITY OF VALENCIA (Spain)

Author keywords

A1. X ray diffraction; A3. Metalorganic chemical vapor deposition; B1. CdTe

Indexed keywords

COMPOSITION; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; CRYSTALLOGRAPHY; DISLOCATIONS (CRYSTALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

CDTE; SAPPHIRE SUBSTRATES; STRUCTURAL CHARACTERIZATIONS; TEXTURE ANALYSIS;

CADMIUM COMPOUNDS;

EID: 4544384134 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.06.043 Document Type: Article

Times cited : (18)

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