Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2004, Pages 1817-1820

  Janezic, Michael D ^a   Kuester, Edward F ^b   Baker Jarvis, James ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Colorado   (United States)

Author keywords

Cavity resonators; Dielectric measurements; Loss tangent; Permittivity

Indexed keywords

DIELECTRIC MEASUREMENTS; LOSS TANGENT; RELATIVE PERMITTIVITY; SPLIT-POST RESONATORS;

CAVITY RESONATORS; CYLINDERS (SHAPES); ELECTRIC FIELDS; FUSED SILICA; MAGNETIC FIELDS; PERMITTIVITY; PERMITTIVITY MEASUREMENT; SUBSTRATES;

DIELECTRIC MATERIALS;

EID: 4544321378     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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