메뉴 건너뛰기




Volumn 45, Issue 7, 2004, Pages 2018-2022

In-situ optical reflection measurement of a Si(100) surface under hydrogen ion irradiation

Author keywords

Hydrogen implantation; Optical reflection; Silicon

Indexed keywords

AMORPHIZATION; ANNEALING; ELECTRONIC STRUCTURE; HYDROGEN; HYDROGEN BONDS; LIGHT REFLECTION; NANOSTRUCTURED MATERIALS; POSITIVE IONS;

EID: 4544321166     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.45.2018     Document Type: Conference Paper
Times cited : (5)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.