Formation of silicon/silicide/oxide nanochains and their properties studied by electron holography

Thin Solid Films

Volumn 464-465, Issue , 2004, Pages 204-207

  Kohno, H ^a   Yoshida, H ^a   Ohno, Y ^a   Ichikawa, S ^b   Akita, T ^b   Tanaka, K ^b   Takeda, S ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Electron holography; Heterojunction; Nanochain; Silicide; Silicon

Indexed keywords

AMORPHOUS SILICON; CHARGE TRANSFER; CRYSTALLIZATION; ELECTRIC VARIABLES MEASUREMENT; ELECTRON HOLOGRAPHY; ENERGY DISPERSIVE SPECTROSCOPY; OXIDATION; PHASE SHIFT; PHOTOLUMINESCENCE; TRANSMISSION ELECTRON MICROSCOPY;

BINDING EFFECT; MULTIPLE SCATTERING; OPTICAL ANALYSIS; VAPOR-LIQUID-SOLID (VLS);

SILICON COMPOUNDS;

EID: 4544229206     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.052     Document Type: Article

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