Plasmon-loss imaging of chains of crystalline-silicon nanospheres and silicon nanowires

Journal of Electron Microscopy

Volumn 49, Issue 2, 2000, Pages 275-280

  Kohno, Hideo ^b   Takeda, Seiji ^b   Tanaka, Koji ^a  

^a OSAKA NATIONAL RESEARCH INSTITUTE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Chains of silicon nanospheres; EELS; Energy filtered TEM; Nanostructure; Plasmon loss imaging; Silicon nanowires

Indexed keywords

CHAINS; CRYSTALLINE MATERIALS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOSPHERES; NANOWIRES; PLASMONS;

CHAIN OF SILICON NANOSPHERE; CHAIN TRANSITIONS; CRYSTALLINE SILICONS; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; NANOSTRUAURE; PLASMON-LOSS; PLASMON-LOSS IMAGING; SILICON CORES; SILICON NANOWIRE; SURFACE OXIDATIONS;

SILICON;

EID: 0034058751     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023807     Document Type: Article

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