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Volumn 51, Issue 5, 2002, Pages 281-290

Analysis of polarization by means of polarized cathodoluminescence spectroscopy in a TEM

Author keywords

Ellipsoidal mirror; Polarization; Polarized cathodoluminescence; Transmission electron microscope

Indexed keywords

ARTICLE;

EID: 0036409479     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/51.5.281     Document Type: Article
Times cited : (16)

References (9)
  • 1
    • 0001663246 scopus 로고    scopus 로고
    • Polarized cathodoluminescence study of selectively grown self-assembled InAs/GaAs quantum dots
    • Rich D H, Tang Y, Konkar A, Chen P, and Madhukar A (1998) Polarized cathodoluminescence study of selectively grown self-assembled InAs/GaAs quantum dots. J. Appl. Phys. 84: 6337-6344.
    • (1998) J. Appl. Phys. , vol.84 , pp. 6337-6344
    • Rich, D.H.1    Tang, Y.2    Konkar, A.3    Chen, P.4    Madhukar, A.5
  • 3
    • 0021439724 scopus 로고
    • Cathodoluminescence and polarization studies from individual dislocations in diamond
    • Yamamoto N, Spence J C H, and Fathy D (1984) Cathodoluminescence and polarization studies from individual dislocations in diamond. Philos. Mag. B 49: 609-629.
    • (1984) Philos. Mag. B , vol.49 , pp. 609-629
    • Yamamoto, N.1    Spence, J.C.H.2    Fathy, D.3
  • 4
    • 0000552278 scopus 로고    scopus 로고
    • Distribution of polarized-cathodoluminescence around the structural defects in ZnSe/GaAs(001) studied by transmission electron microscopy
    • Mitsui T and Yamamoto N (1997) Distribution of polarized-cathodoluminescence around the structural defects in ZnSe/GaAs(001) studied by transmission electron microscopy. J. Appl. Phys. 81: 7492-7496.
    • (1997) J. Appl. Phys. , vol.81 , pp. 7492-7496
    • Mitsui, T.1    Yamamoto, N.2
  • 5
    • 0028514768 scopus 로고
    • Polarized-cathodoluminescence study of stress for GaAs grown selectively on patterned Si(100)
    • Tang Y, Rich D H, Lingunis E H, and Haegel N M (1994) Polarized-cathodoluminescence study of stress for GaAs grown selectively on patterned Si(100). J. Appl. Phys. 76: 3032-3040.
    • (1994) J. Appl. Phys. , vol.76 , pp. 3032-3040
    • Tang, Y.1    Rich, D.H.2    Lingunis, E.H.3    Haegel, N.M.4
  • 7
    • 0029390161 scopus 로고
    • A new apparatus for in-situ photoluminescence spectroscopy in a transmission electron microscope
    • Ohno Y and Takeda S (1995) A new apparatus for in-situ photoluminescence spectroscopy in a transmission electron microscope. Rev. Sci. Instr. 66: 4866-4869.
    • (1995) Rev. Sci. Instr. , vol.66 , pp. 4866-4869
    • Ohno, Y.1    Takeda, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.