Metal-mediated growth of alternate semiconductor-insulator nanostructures

Solid State Communications

Volumn 116, Issue 11, 2000, Pages 591-594

  Kohno, H ^a   Iwasaki, T ^a   Takeda, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CATALYSTS; CRYSTAL GROWTH; ELECTRON ENERGY LOSS SPECTROSCOPY; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE-SILICON NANOSPHERES; METAL-MEDIATED GROWTH; SEMICONDUCTOR-INSULATOR NANOSTRUCTURES;

NANOSTRUCTURED MATERIALS;

EID: 0034299575     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(00)00389-6     Document Type: Article

References (11)

1. Canham L.T. Appl. Phys. Lett. 57:1990;1046.
2. Wagner R.S., Ellis W.C. Appl. Phys. Lett. 4:1964;89.
3. Ozaki N., Ohno Y., Takeda S. Appl. Phys. Lett. 73:1998;3700.
4. Holmes J.D., Johnston K.P., Doty R.C., Korgel B.A. Science. 287:2000;1471.
5. Kohno H., Takeda S. Appl. Phys. Lett. 73:1998;3144.
6. Kohno H., Takeda S. J. Cryst. Growth. 216:2000;185.
7. Gangopadhyay U., Wynblatt P. J. Mater. Sci. 30:1995;94.
8. Ahn C.C., Krivanek O.L. EELS Atlas. 1983;Gatan, Pennsylvania.
9. Egerton R.F. Electron Energy-Loss Spectroscopy in the Electron Microscope. 2nd ed. 1996;Plenum, New York.
10. Ugarte D., Colliex C.C., Trebbia P. Phys. Rev. B. 45:1992;4332.
11. Munninx S., Schmeits M. Phys. Rev. B. 32:1985;4192.