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Volumn 354, Issue 31, 2008, Pages 3780-3784

Underlying reverse current mechanisms in a-Si:H p+-i-n+ solar cell and compact SPICE modeling

Author keywords

Silicon; Solar cells

Indexed keywords

ANNEALING; CURRENT VOLTAGE CHARACTERISTICS; DEFECT STRUCTURES; INTERFACES (MATERIALS); LEAKAGE CURRENTS; SPICE;

EID: 45049085432     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.03.041     Document Type: Article
Times cited : (7)

References (23)
  • 4
    • 45049086247 scopus 로고    scopus 로고
    • Jingdong Deng, Benjamin Rross, Mathew Albert, Robert Collins, Christopher Wronski, Mat. Res. Soc. Symp. Proc., 910, 2006, 0910-A02-02.
    • Jingdong Deng, Benjamin Rross, Mathew Albert, Robert Collins, Christopher Wronski, Mat. Res. Soc. Symp. Proc., 910, 2006, 0910-A02-02.
  • 6
    • 1642541227 scopus 로고    scopus 로고
    • Todd R. Johnson, Gautam Ganguly, George S. Wood, David E. Carlson, Mat. Res. Soc. Symp. Proc., 762, 2003, A7.7.1.
    • Todd R. Johnson, Gautam Ganguly, George S. Wood, David E. Carlson, Mat. Res. Soc. Symp. Proc., 762, 2003, A7.7.1.
  • 8
    • 0036920114 scopus 로고    scopus 로고
    • S. Morrison, P. Servati, Y. Vygranenko, A. Nathan, A. Madan, Mat. Res. Soc. Symp. Proc., vol. 715, 2002, p. A7.4.1.
    • S. Morrison, P. Servati, Y. Vygranenko, A. Nathan, A. Madan, Mat. Res. Soc. Symp. Proc., vol. 715, 2002, p. A7.4.1.
  • 9
    • 45049085816 scopus 로고    scopus 로고
    • Jeremy A. Theil, in: Mat. Res. Soc. Symp. Proc., vol. 762, 2003, p. A21.4.1.
    • Jeremy A. Theil, in: Mat. Res. Soc. Symp. Proc., vol. 762, 2003, p. A21.4.1.
  • 23
    • 45049085214 scopus 로고    scopus 로고
    • Guozhen Yue, Baojie Yan, Gautam Ganguly, Jeffrey Yang, Subhendu Guha, Mat. Res. Soc. Symp. Proc., 910, 2006, 0910-A02-01.
    • Guozhen Yue, Baojie Yan, Gautam Ganguly, Jeffrey Yang, Subhendu Guha, Mat. Res. Soc. Symp. Proc., 910, 2006, 0910-A02-01.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.