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Volumn 354, Issue 31, 2008, Pages 3780-3784
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Underlying reverse current mechanisms in a-Si:H p+-i-n+ solar cell and compact SPICE modeling
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Author keywords
Silicon; Solar cells
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Indexed keywords
ANNEALING;
CURRENT VOLTAGE CHARACTERISTICS;
DEFECT STRUCTURES;
INTERFACES (MATERIALS);
LEAKAGE CURRENTS;
SPICE;
DEFECT STATES;
REVERSE BIAS ANNEALING (RBA) TREATMENT;
THERMAL GENERATION;
VOLTAGE CONTROLLED CURRENT SOURCES (VCCS);
SILICON SOLAR CELLS;
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EID: 45049085432
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2008.03.041 Document Type: Article |
Times cited : (7)
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References (23)
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