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Volumn 103, Issue 10, 2008, Pages
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Defect reduction of GaAs/Si epitaxy by aspect ratio trapping
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
COALESCENCE;
DEFECTS;
EPITAXIAL GROWTH;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
COALESCENCE DEFECT FORMATION;
COALESCENCE-INDUCED THREADING DISLOCATIONS;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 44649190498
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2924410 Document Type: Article |
Times cited : (63)
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References (14)
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