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Volumn 103, Issue 10, 2008, Pages

Defect reduction of GaAs/Si epitaxy by aspect ratio trapping

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; COALESCENCE; DEFECTS; EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION;

EID: 44649190498     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2924410     Document Type: Article
Times cited : (63)

References (14)
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.