Quantification of polypropylene surface chemical groups using principal components regression and ToF-SIMS and XPS data

Journal of Physics: Conference Series

Volumn 100, Issue 1, 2008, Pages

  Awaja, F ^a  

^a DEAKIN UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FORECASTING; METALLIC FILMS; NANOSCIENCE; PLASTIC FILMS; POLYPROPYLENES; X RAY PHOTOELECTRON SPECTROSCOPY;

ACCURATE PREDICTION; ATOMIC CONCENTRATION; MULTI-COMPONENT MODELING; PRINCIPAL COMPONENTS; QUANTITATIVE TECHNIQUES; RELATIVE CONCENTRATION; SURFACE FUNCTIONAL GROUPS; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

EID: 44649183483     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/100/1/012026     Document Type: Article

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