Effect of sol strength on growth, faceting and orientation of sol-gel derived ZnO nanostructures

IEEE Sensors Journal

Volumn 8, Issue 6, 2008, Pages 831-836

  Bahadur, Harish ^a,b   Srivastava, A K ^b   Rashmi, ^b   Chandra, Sudhir ^c  

^a IEEE

^b NATIONAL PHYSICAL LABORATORY   (India)

^c INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

Electron microscopy; Nanostructures; Sol gel thin films; x ray diffraction; ZnO

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ACOUSTIC SURFACE WAVE FILTERS; ACOUSTIC WAVE VELOCITY; ACOUSTIC WAVES; ACOUSTICS; COLLOIDS; COMPUTER NETWORKS; CRYSTAL STRUCTURE; CRYSTALLITE SIZE; CRYSTALLITES; CUBIC BORON NITRIDE; DETECTORS; DIFFRACTION; ELECTRIC CURRENTS; EPITAXIAL GROWTH; ESTIMATION; GELATION; GELS; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MORPHOLOGY; NANOCRYSTALLINE ALLOYS; NANOSTRUCTURES; NATURAL RESOURCES; PHOTOACOUSTIC EFFECT; PIEZOELECTRICITY; SEMICONDUCTING FILMS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SENSORS; SILICON; SOL-GEL PROCESS; SOL-GELS; SOLS; SURFACES; TECHNOLOGY; THICK FILMS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC ALLOYS; ZINC COMPOUNDS; ZINC SULFIDE;

(1 1 1) ORIENTATION; (E ,3E) PROCESS; (OTDR) TECHNOLOGY; C AXIS ORIENTED; DIFFRACTION PEAKS; FACETED MORPHOLOGY; MEMS BASED SENSORS; NANOELECTRONIC; PIEZOELECTRIC (PZT) SENSORS; PRECURSOR MATERIALS; PREFERRED ORIENTATION (PO); SAMPLE SURFACES; SEMICONDUCTING PROPERTIES; SOL - GEL; STRENGTH (IGC: D5/D6); SURFACE ACOUSTIC WAVE (SAW); XRD PATTERNS; ZINC ACETATES; ZNO CRYSTALS; ZNO FILMS; ZNO NANOSTRUCTURES; ZNO ON SI; ZNO THIN FILMS;

ZINC OXIDE;

EID: 44649155672     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2008.923248     Document Type: Article

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