Deep level transient spectroscopy in quantum dot characterization

Nanoscale Research Letters

Volumn 3, Issue 5, 2008, Pages 179-185

  Engstrom O ^a   Kaniewska, M ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

Author keywords

Deep level transient spectroscopy; Electrical properties; Electron states in low dimensional structures; III V semiconductors; Quantum dots

Indexed keywords

TEMPERATURE-VOLTAGE REPRESENTATION; THERMAL PROCESSES;

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC POTENTIAL; ELECTRON ENERGY LEVELS; THERMAL EFFECTS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 44649152860     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1007/s11671-008-9133-5     Document Type: Article

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