Tunneling emission from self-assembled InAs quantum dots probed with capacitance transients

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 3, 2006, Pages

  Schulz, Stephan ^a   Schramm, Andreas ^a   Heyn, Christian ^a   Hansen, Wolfgang ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746545034     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.033311     Document Type: Article

References (20)

1. H. Drexler, D. Leonard, W. Hansen, J. P. Kotthaus, and P. M. Petroff, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.73.2252 73, 2252 (1994).
2. B. T. Miller, W. Hansen, S. Manus, R. J. Luyken, A. Lorke, J. P. Kotthaus, S. Huant, G. Medeiros-Ribeiro, and P. M. Petroff, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.56.6764 56, 6764 (1997).
3. R. Wetzler, A. Wacker, E. Scholl, C. M. A. Kapteyn, R. Heitz, and D. Bimberg, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1290137 77, 1671 (2000).
4. K. H. Schmidt, C. Bock, M. Versen, U. Kunze, D. Reuter, and A. D. Wieck, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1703827 95, 5715 (2004).
5. S. Anand, N. Carlsson, M.-E. Pistol, L. Samuelson, and W. Seifert, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.114937 67, 3016 (1995).
6. S. Anand, N. Carlsson, M.-E. Pistol, L. Samuelson, and W. Seifert, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.368553 84, 3747 (1998).
7. C. M. A. Kapteyn, F. Heinrichsdorff, O. Stier, R. Heitz, M. Grundmann, N. D. Zakharov, D. Bimberg, and P. Werner, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.60.14265 60, 14265 (1999).
8. C. M. A. Kapteyn, M. Lion, R. Heitz, D. Bimberg, P. Brunkov, B. V. Volovik, S. G. Konnikov, A. R. Kovsh, and V. M. Ustinov, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.126099 76, 1573 (2000).
9. O. Engström, M. Malmkvist, Y. Fu, H. O. Olafson, and E. O. Sveinbjörnsson, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1622437 83, 3578 (2003).
10. S. Schulz, S. Schnüll, C. Heyn, and W. Hansen, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.69.195317 69, 195317 (2004).
11. S. K. Zhang, H. J. Zhu, F. Lu, Z. M. Jiang, and X. Wang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.80.3340 80, 3340 (1998).
12. W.-H. Chang, W. Y. Chen, M. C. Cheng, C. Y. Lai, T. M. Hsu, N.-T. Yeh, and J.-I. Chyi, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.125315 64, 125315 (2001).
13. O. Engström, M. Kaniewska, Y. Fu, J. Piscator, and M. Malmkvist, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1802377 85, 2908 (2004).
14. S. Schulz, A. Schramm, T. Zander, C. Heyn, and W. Hansen, in Proceedings of the 27th International Conference on the Physics of Semiconductors, Flagstaff, Arizona, 2005, edited by, J. Menendez, and, C. G. V. de Walle,, AIP Conf. Proc. No. 772 (AIP, New York, 2005), p. 807.
15. W.-H. Chang, W. Y. Chen, T. M. Hsu, N.-T. Yeh, and J.-I. Chyi, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.66.195337 66, 195337 (2002).
16. O. Engström and P. T. Landsberg, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.075360 72, 075360 (2005).
17. D. V. Lang, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1663719 45, 3023 (1974).
18. P. Blood and J. Orton, The Electrical Characterization of Semiconductors: Majority Carriers and Electron States, edited by, N. H. March, (Academic Press, London, 1992).
19. E. N. Korol, Sov. Phys. Solid State SPSSA7 0038-5654 8, 1327 (1977).
20. R. J. Warburton, B. T. Miller, C. S. Dürr, C. Bödefeld, K. Karrai, J. P. Kotthaus, G. Medeiros-Ribeiro, P. M. Petroff, and S. Huant, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.58.16221 58, 16221 (1998).