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Volumn 16, Issue 11, 2008, Pages 7778-7788

High speed interferometric ellipsometer

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT MODULATION; MEASUREMENT THEORY; PARAMETER ESTIMATION;

EID: 44649129201     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.007778     Document Type: Article
Times cited : (16)

References (16)
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    • Polarized differential phase laser scanning microscope
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  • 12
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    • Balanced detector interferometric ellipsometer
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    • Effect of elliptical birefringence on the measurement of the phase retardation of a quartz wave plate by an optical heterodyne polarimeter
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.