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Applied Optics

Volumn 43, Issue 22, 2004, Pages 4362-4366

Interferometric ellipsometer with wavelength-modulated laser diode source

(2) Watkins, Lionel R a Hoogerland, Maarten D a

a UNIVERSITY OF AUCKLAND (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC NOISE; ALGORITHMS; BROADBAND AMPLIFIERS; DIELECTRIC DEVICES; ELECTRIC CURRENTS; ELLIPSOMETRY; EXTRAPOLATION; INTERFEROMETRY; LIGHT POLARIZATION; MIRRORS; OPTICAL BEAM SPLITTERS; REFRACTIVE INDEX;

ELECTRICAL SIGNALS; FRINGE ANALYSIS; MICHELSON INTERFEROMETERS; TEMPERATURE TUNING;

SEMICONDUCTOR LASERS;

EID: 4043182895 PISSN: 1559128X EISSN: 15394522 Source Type: Journal
DOI: 10.1364/AO.43.004362 Document Type: Article

Times cited : (17)

References (9)

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2
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4
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8
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