-
1
-
-
0007605364
-
Control of the bias tilt angles in nematic liquid crystals
-
S. V. Yablonskiǐ, K. Nakayama, S. Okazaki, M. Ozaki, K. Yoshino, S. P. Palto, M. Y. Baranovich, and A. S. Michailov, "Control of the bias tilt angles in nematic liquid crystals," J. Appl. Phys. 85, 2556-2561 (1999).
-
(1999)
J. Appl. Phys
, vol.85
, pp. 2556-2561
-
-
Yablonskiǐ, S.V.1
Nakayama, K.2
Okazaki, S.3
Ozaki, M.4
Yoshino, K.5
Palto, S.P.6
Baranovich, M.Y.7
Michailov, A.S.8
-
2
-
-
0032068832
-
Evaluation of tilt angles of nematic liquid crystal molecules on polyimide Langmuir-Blodgett films using the attenuated total reflection measurement, method
-
A. Baba, F. Kaneko, K. Shinbo, K. Kato, S. Kobayashi, and T. Wakamatsu, "Evaluation of tilt angles of nematic liquid crystal molecules on polyimide Langmuir-Blodgett films using the attenuated total reflection measurement, method," Jpn. J. Appl. Phys. 37, 2581-2586 (1998).
-
(1998)
Jpn. J. Appl. Phys
, vol.37
, pp. 2581-2586
-
-
Baba, A.1
Kaneko, F.2
Shinbo, K.3
Kato, K.4
Kobayashi, S.5
Wakamatsu, T.6
-
3
-
-
0034248065
-
Accurate optical determination of liquid crystal tilt angle by the half-leaky guided mode technique
-
Q. Lin, H. Zhu, Y. Tang, F. Yang, and H. Gao, "Accurate optical determination of liquid crystal tilt angle by the half-leaky guided mode technique," Displays 21, 111-119 (2000).
-
(2000)
Displays
, vol.21
, pp. 111-119
-
-
Lin, Q.1
Zhu, H.2
Tang, Y.3
Yang, F.4
Gao, H.5
-
4
-
-
0036308180
-
Low-cell-gap measurement by rotation of a wave retarder
-
S. H. Lee, W. S. Park, G. D. Lee, K. Y. Han, T. H. Yoon, and J. C. Kin, "Low-cell-gap measurement by rotation of a wave retarder," Jpn. J. Appl. Phys. 41, 379-383 (2002).
-
(2002)
Jpn. J. Appl. Phys
, vol.41
, pp. 379-383
-
-
Lee, S.H.1
Park, W.S.2
Lee, G.D.3
Han, K.Y.4
Yoon, T.H.5
Kin, J.C.6
-
5
-
-
0022094958
-
An interferometric method of measuring tilt angles in aligned thin films of nematic liquid crystals
-
R. Simon and D. M. Nicholas, "An interferometric method of measuring tilt angles in aligned thin films of nematic liquid crystals," J. Phys. D: Appl. Phys. 18, 1423-1430 (1985).
-
(1985)
J. Phys. D: Appl. Phys
, vol.18
, pp. 1423-1430
-
-
Simon, R.1
Nicholas, D.M.2
-
6
-
-
0035874857
-
Measurements of cell thickness distributions in reflective liquid crystal cells using a two-dimensional stokes parameter method
-
M. Kawamura and S. Sato, "Measurements of cell thickness distributions in reflective liquid crystal cells using a two-dimensional stokes parameter method," Jpn. J. Appl. Phys. 40, L621-624 (2001).
-
(2001)
Jpn. J. Appl. Phys
, vol.40
-
-
Kawamura, M.1
Sato, S.2
-
7
-
-
2142767428
-
A two-dimensional pretilt angle distribution measurement of twisted nematic liquid crystal cells using Stokes parameters at plural wavelengths
-
M. Kawamura, Y. Goto, and S. Sato, "A two-dimensional pretilt angle distribution measurement of twisted nematic liquid crystal cells using Stokes parameters at plural wavelengths" Jpn. J. Appl. Phys. 43, 709-714 (2004).
-
(2004)
Jpn. J. Appl. Phys
, vol.43
, pp. 709-714
-
-
Kawamura, M.1
Goto, Y.2
Sato, S.3
-
8
-
-
0003014506
-
Transmissive liquid crystal cell parameters measurement by spectroscopic ellipsometry
-
S. T. Tang and H. S. Kwok, "Transmissive liquid crystal cell parameters measurement by spectroscopic ellipsometry," J. Appl. Phys. 89, 80-85 (2001).
-
(2001)
J. Appl. Phys
, vol.89
, pp. 80-85
-
-
Tang, S.T.1
Kwok, H.S.2
-
9
-
-
12844269853
-
Cell thickness and surface pretilt angle measurements of a planar liquid-crystal cell with obliquely incidence light
-
H. L. Ong, "Cell thickness and surface pretilt angle measurements of a planar liquid-crystal cell with obliquely incidence light," J. Appl. Phys. 71, 140-144 (1992).
-
(1992)
J. Appl. Phys
, vol.71
, pp. 140-144
-
-
Ong, H.L.1
-
10
-
-
34547775186
-
Linear birefringence parameters of an uncoated multiple-order wave plate with a phase-sensitive optical, heterodyne ellipsometry,
-
M.S. thesis Institute of Biophotonics, National Yang-Ming University, Taiwan
-
C. H. Hsieh, "Linear birefringence parameters of an uncoated multiple-order wave plate with a phase-sensitive optical, heterodyne ellipsometry," M.S. thesis (Institute of Biophotonics, National Yang-Ming University, Taiwan 2006).
-
(2006)
-
-
Hsieh, C.H.1
-
11
-
-
0031675886
-
Polarized optical heterodyne profilometer
-
Y. C. Huang, C. Chou, L. Y. Chou, J. C. Shyu, and M. Chang, "Polarized optical heterodyne profilometer," Jpn. J. Appl. Phys. 37, 351-354 (1998).
-
(1998)
Jpn. J. Appl. Phys
, vol.37
, pp. 351-354
-
-
Huang, Y.C.1
Chou, C.2
Chou, L.Y.3
Shyu, J.C.4
Chang, M.5
-
12
-
-
30844472908
-
Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferoinetric ellipsometry
-
C. C. Tsai, C. Chou, C. Y. Han, C. H. Hsieh, K. Y. Liao, and Y. F. Chao, "Determination of optical parameters of a twisted-nematic liquid crystal by phase-sensitive optical heterodyne interferoinetric ellipsometry," Appl. Opt. 44, 7509-7514 (2005).
-
(2005)
Appl. Opt
, vol.44
, pp. 7509-7514
-
-
Tsai, C.C.1
Chou, C.2
Han, C.Y.3
Hsieh, C.H.4
Liao, K.Y.5
Chao, Y.F.6
-
13
-
-
0012053884
-
Zeeman laser-scanning confocal microscopy in turbid media
-
L. C. Peng, C. Chou, C. W. Lyu, and J. C. Hsieh, "Zeeman laser-scanning confocal microscopy in turbid media," Opt. Lett. 26, 349-351 (2001).
-
(2001)
Opt. Lett
, vol.26
, pp. 349-351
-
-
Peng, L.C.1
Chou, C.2
Lyu, C.W.3
Hsieh, J.C.4
-
14
-
-
0034318705
-
Real-time, micrometer depth-resolved imaging by low-coherence reflectometry and a two-dimensional heterodyne detection technique
-
M. Aldba, K. P. Chan, and N. Tanno, "Real-time, micrometer depth-resolved imaging by low-coherence reflectometry and a two-dimensional heterodyne detection technique," Jpn. J. Appl. Phys. 39, L1194-L1196 (2000).
-
(2000)
Jpn. J. Appl. Phys
, vol.39
-
-
Aldba, M.1
Chan, K.P.2
Tanno, N.3
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