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Volumn 15, Issue 16, 2007, Pages 10381-10389

Characterization of a nematic PALC at large oblique incidence angles

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; INTERFEROMETRY; SIGNAL TO NOISE RATIO;

EID: 34547798007     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.010381     Document Type: Article
Times cited : (7)

References (14)
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    • An interferometric method of measuring tilt angles in aligned thin films of nematic liquid crystals
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    • Transmissive liquid crystal cell parameters measurement by spectroscopic ellipsometry
    • S. T. Tang and H. S. Kwok, "Transmissive liquid crystal cell parameters measurement by spectroscopic ellipsometry," J. Appl. Phys. 89, 80-85 (2001).
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    • C. H. Hsieh, "Linear birefringence parameters of an uncoated multiple-order wave plate with a phase-sensitive optical, heterodyne ellipsometry," M.S. thesis (Institute of Biophotonics, National Yang-Ming University, Taiwan 2006).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.