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Journal of Applied Physics

Volumn 103, Issue 10, 2008, Pages

Effect of microwave irradiation on the emission and capture dynamics in silicon metal oxide semiconductor field effect transistors

(5) Prati, Enrico a Fanciulli, Marco a Calderoni, Alessandro b Ferrari, Giorgio b Sampietro, Marco b

a LABORATORIO MDM (Italy)

b POLITECNICO DI MILANO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; MICROWAVE IRRADIATION; QUANTUM THEORY; VOLTAGE CONTROL;

CAPTURE DYNAMICS; QUANTUM INFORMATION PROCESSING;

MOSFET DEVICES;

EID: 44649127340 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2924407 Document Type: Article

Times cited : (18)

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