XRF spectrometers based on monolithic arrays of silicon drift detectors: Elemental mapping analyses and advanced detector structures

IEEE Transactions on Nuclear Science

Volumn 53, Issue 2, 2006, Pages 641-647

  Longoni, A ^a   Fiorini, C ^a   Guazzoni, C ^a   Buzzetti, S ^a   Bellini, M ^a   Struder, L ^a   Lechner, P ^a   Bjeoumikhov, A ^a   Kemmer, J ^a  

^a NONE

Author keywords

Elemental mapping; Silicon drift detectors; X ray fluorescence (XRF); X ray optics; X ray spectrometry

Indexed keywords

FLUORESCENCE; RADIATION DETECTORS; SILICON; X RAY OPTICS;

ELEMENTAL MAPPING; SILICON DRIFT DETECTORS; X-RAY FLUORESCENCE (XRF); X-RAY SPECTROMETRY;

X RAY SPECTROMETERS;

EID: 33646414221     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.872640     Document Type: Article

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