Characterization of novel Ag on TiO2 films for surface-enhanced Raman scattering

Applied Spectroscopy

Volumn 58, Issue 8, 2004, Pages 922-933

  Mills, A ^a   Hill, G ^a   Stewart, M ^a   Graham, D ^a   Smith, W E ^a   Hodgen, S ^a   Halfpenny, P J ^a   Faulds, K ^a   Robertson, P ^b  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b ROBERT GORDON UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTODEPOSITION; SEMICONDUCTOR PHOTOCATALYSIS; SURFACE ENHANCED RAMAN SCATTERING; ULTRAVIOLET VISIBLE SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; MATERIALS TESTING; OPTICAL PROPERTIES; PHOTOCATALYSIS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING FILMS; SILVER; SURFACE PHENOMENA; TITANIUM DIOXIDE; ULTRAVIOLET SPECTROSCOPY; VAPOR DEPOSITION;

RAMAN SPECTROSCOPY;

EID: 4444379770     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702041655520     Document Type: Article

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