SCOPUS 정보 검색 플랫폼

Volumn 389-393, Issue 1, 2002, Pages 103-106

Self-healing phenomenon of micropipes in silicon carbide

(9) Okamoto, Atsuto a Seno, Yoshiki a Sugiyama, Naohiro a Hirose, Fusao b Hara, Kazukuni b Tani, Toshihiko a Nakamura, Daisuke a Kamiya, Nobuo a Onda, Shoichi b

a Rd Management Section (Japan)

b DENSO CORPORATION (Japan)

Author keywords

Dislocations; Micropipes; Self healing; Stacking faults; TEM

Indexed keywords

DISLOCATIONS (CRYSTALS); RESIDUAL STRESSES; SCREWS; STACKING FAULTS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; EDGE DISLOCATIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCREW DISLOCATIONS; SILICON CARBIDE;

EDGE DISLOCATIONS; MICROPIPES; RESIDUAL STRAINS; SCREW DISLOCATION; HOLLOW TUBE; OPTICAL OBSERVATIONS; SELF-HEALING; SIC SUBSTRATES;

SILICON CARBIDE; SELF-HEALING MATERIALS;

EID: 4444375600 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.389-393.103 Document Type: Article

Times cited : (9)

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