Surface phase transitions and related surface defect structures upon reduction of epitaxial WO 3(100) thin films: A scanning tunneling microscopy study

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 4, 2004, Pages 1682-1689

  Li, M ^a   Altman, E I ^a   Posadas, A ^a   Ahn, C H ^a  

^a Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK REDUCTION; CRYSTALLOGRAPHIC SHEAR PLANES; STRANDED SURFACES; SURFACE PHASE TRANSITION;

ALUMINUM COMPOUNDS; CRYSTALLOGRAPHY; DEFECTS; EPITAXIAL GROWTH; LANTHANUM COMPOUNDS; MORPHOLOGY; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; STRESS ANALYSIS; TUNGSTEN COMPOUNDS;

THIN FILMS;

EID: 4444355468     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1756880     Document Type: Conference Paper

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