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Volumn , Issue , 2004, Pages 635-638

An equivalent circuit model for a faraday cage substrate crosstalk isolation structure

Author keywords

Crosstalk; Isolation; Modeling; Substrate noise

Indexed keywords

ISOLATION; MODELING; SUBSTRATE NOISE; SYSTEM-ON-CHIP (SOC);

EID: 4444339051     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (8)
  • 1
    • 0036441806 scopus 로고    scopus 로고
    • On-chip RF isolation techniques
    • T. Blalack, Y. Leclercq, and C. P. Yue, " On-chip RF isolation techniques," in IEEE BCTM, 205-211, 2002.
    • (2002) IEEE BCTM , pp. 205-211
    • Blalack, T.1    Leclercq, Y.2    Yue, C.P.3
  • 2
    • 0029507118 scopus 로고
    • Signal isolation in BiCMOS mixed mode integrated circuits
    • K. Joardar, " Signal isolation in BiCMOS mixed mode integrated circuits," in IEEE BCTM, 178-181, 1995.
    • (1995) IEEE BCTM , pp. 178-181
    • Joardar, K.1
  • 5
    • 0035446333 scopus 로고    scopus 로고
    • An insulator-lined silicon substrate-via technology with high aspect ratio
    • J. H. Wu, J. Scholvin, and J. A. del Alamo, " An insulator-lined silicon substrate-via technology with high aspect ratio," IEEE Trans. Elec. Dev., vol. 48, pp. 2181-2183, 2001.
    • (2001) IEEE Trans. Elec. Dev. , vol.48 , pp. 2181-2183
    • Wu, J.H.1    Scholvin, J.2    Del Alamo, J.A.3
  • 6
    • 0033727203 scopus 로고    scopus 로고
    • Suppression of substrate crosstalk in mixed-signal complementary MOS circuits using high-resistivity SIMOX (Separation by IMplanted OXygen) wafers
    • J. Kodate, M. Harada, and T. Tsukahara, " Suppression of substrate crosstalk in mixed-signal complementary MOS circuits using high-resistivity SIMOX (Separation by IMplanted OXygen) wafers," Japanese Journal of Applied Physics Part 1, vol. 39, pp. 2256-2260, 2000.
    • (2000) Japanese Journal of Applied Physics Part 1 , vol.39 , pp. 2256-2260
    • Kodate, J.1    Harada, M.2    Tsukahara, T.3
  • 8
    • 0035689307 scopus 로고    scopus 로고
    • Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design
    • W. Jin, Y. Eo, W. R. Shim, W. R. Eisenstadt, M. Y. Park, and H. K. Yu, " Silicon substrate coupling noise modeling, analysis, and experimental verification for mixed signal integrated circuit design," in IEEE MTT-S Int. Microwave Symp., 1727-1730, 2001.
    • (2001) IEEE MTT-S Int. Microwave Symp. , pp. 1727-1730
    • Jin, W.1    Eo, Y.2    Shim, W.R.3    Eisenstadt, W.R.4    Park, M.Y.5    Yu, H.K.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.