High performance and high reliability InP HEMT low noise amplifiers for phased-array applications

IEEE MTT-S International Microwave Symposium Digest

Volumn 1, Issue , 2004, Pages 157-160

  Grundbacher, Ronald ^a   Chou, Yeong Chang ^a   Lai, Richard ^a   Ip, Kwan ^a   Kam, Stuart ^a   Barsky, Mike ^a   Hayashibara, George ^a   Leung, Denise ^a   Eng, David ^a   Tsai, Roger ^a   Nishimoto, Matt ^a   Block, Tom ^a   Liu, Po Hsin ^a   Oki, Aaron ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

HEMT; Low noise amplifiers; MMICs; Phased array; Reliability

Indexed keywords

LOW NOISE AMPLIFIERS; MEAN-TIME-TO-FAILURE; PHASED ARRAY; TOTAL THICKNESS;

ACOUSTIC NOISE; ACTIVATION ENERGY; AMPLIFIERS (ELECTRONIC); ANTENNA PHASED ARRAYS; ELECTRIC POTENTIAL; ETCHING; FREQUENCIES; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; RELIABILITY; SEMICONDUCTING INDIUM;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 4444332174     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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2. 0.25As Channel", IEEE Electron Device Letters, Vol. 24, No. 6, pp. 378-380.
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