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Volumn 116, Issue 1, 2004, Pages 137-144

On the relationship between the temperature coefficient of resistance and the thermal conductance of integrated metal resistors

Author keywords

Integrated metal resistor; Microheater; Microsensor

Indexed keywords

INTEGRATED METAL RESISTORS; JOULE HEATING; MICROHEATERS; TEMPERATURE COEFFICIENT OF RESISTANCE (TCR);

EID: 4444322827     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2004.04.003     Document Type: Article
Times cited : (20)

References (12)
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    • F.M. d'Heurle, P.S. Ho, Electromigration in thin films, in: J.M. Poate, K.N. Tu, J.W. Mayer (Eds.), Thin Films - Interdiffusion and Reactions, Wiley/Interscience, New York, 1978, pp. 243-303.
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    • New materials and heater geometry for high performance micromachined thermally insulated structures in gas sensor applications
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    • L. Dori, P. Maccagnani, G.C. Cardinali, M. Fiorini, I. Sayago, S. Guerri, R. Rizzoli, G. Sberveglieri, New materials and heater geometry for high performance micromachined thermally insulated structures in gas sensor applications, in: Proceedings of the Eurosensors, vol. XI, Warsaw, Poland, 1997, pp. 289-292.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.