Stray fields of domains in permalloy microstructures - Measurements and simulations

Journal of Applied Physics

Volumn 95, Issue 10, 2004, Pages 5641-5645

  Barthelmess, M ^a   Pels, C ^a   Thieme, A ^a   Meier, G ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRON BEAM LITHOGRAPHY; FERROMAGNETIC MATERIALS; IMAGE QUALITY; MAGNETIC ANISOTROPY; MAGNETIZATION; MAGNETOSTATICS; NICKEL ALLOYS; THIN FILMS; X RAY ANALYSIS;

CROSS-TIE WALLS; MAGNETIC-FORCE MICROSCOPY (MFM); MICROMAGNETIC SIMULATIONS; POINT DIPOLE APPROXIMATION; SPIN ORIENTATION;

MICROSTRUCTURE;

EID: 2942514888     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1697642     Document Type: Article

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