Ferromagnetic ultra-small tunnel junction devices fabricated by scanning probe microscope (SPM) local oxidation

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2640-2642

  Shirakashi, Jun Ichi ^a   Takemura, Yasushi ^b  

^a AKITA PREFECTURAL UNIVERSITY   (Japan)

^b YOKOHAMA NATIONAL UNIVERSITY   (Japan)

Author keywords

Magnetic thin film devices; Magnetoresistive devices; Nanotechnology; Tunneling

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON TUNNELING; FERROMAGNETIC MATERIALS; MAGNETIC THIN FILMS; MAGNETOSTRICTIVE DEVICES; MICROSCOPIC EXAMINATION; NANOTECHNOLOGY; OXIDATION; SCANNING; TRANSISTORS;

DRAIN ELECTRODES; FERROMAGNETIC SINGLE ELECTRON TRANSISTORS (FMSET); LOCAL OXIDATION; SCANNING PROBE MICROSCOPE (SPM);

TUNNEL JUNCTIONS;

EID: 4444247599     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.829166     Document Type: Article

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