Measuring local lattice polarity in AlN and GaN by high resolution Z -contrast imaging: The case of (0001) and (11̄00) GaN quantum dots

Applied Physics Letters

Volumn 92, Issue 20, 2008, Pages

  Rouviere, Jean Luc ^a   Bougerol, Catherine ^a   Amstatt, Benoit ^a   Bellet Almaric, Edith ^a   Daudin, Bruno ^a  

^a CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; GALLIUM NITRIDE; LATTICE CONSTANTS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC COLUMNS; CONTRAST IMAGING; LATTICE POLARITY; TUNNEL POSITIONS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 44349190892     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2917449     Document Type: Article

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