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Volumn 202, Issue 13, 2008, Pages 2837-2843

Characterization of magnetron sputtered rhodium films for reflective coatings

Author keywords

Grain growth; ITER; Magnetron sputtering; Optical properties; Rhodium film; XPS

Indexed keywords

CRYSTAL STRUCTURE; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL CONSTANTS; REFLECTION; RHODIUM; SURFACE ROUGHNESS;

EID: 44249106388     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2007.10.014     Document Type: Article
Times cited : (54)

References (31)
  • 19
    • 44249085841 scopus 로고    scopus 로고
    • Powder diffraction file, card no. 05-0685, Joint Committee on Powder Diffraction Standards, 1953.
    • Powder diffraction file, card no. 05-0685, Joint Committee on Powder Diffraction Standards, 1953.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.