Factors influencing local potential drop in bottom-contact organic thin-film transistor using solution-processible tetrabenzoporphyrin

Organic Electronics

Volumn 9, Issue 4, 2008, Pages 439-444

  Xu, Mingsheng ^a   Ohno, Akira ^b   Aramaki, Shinji ^b   Kudo, Kazuhiro ^a   Nakamura, Masakazu ^a  

^a CHIBA UNIVERSITY   (Japan)

^b MITSUBISHI CHEMICAL CORPORATION   (Japan)

Author keywords

Atomic force microscope potentiometry; Organic thin film transistors; Potential distribution; Solution based processes

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; OXYGEN; THIN FILM TRANSISTORS;

POTENTIAL DISTRIBUTION; SOLUTION BASED PROCESSES;

ELECTRIC POTENTIAL;

EID: 43849109675     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2008.02.005     Document Type: Article

References (14)

1. T. Hassenkam D.R. Greve T. Bjornholm Adv. Mater. 13 2001 631
2. K. Seshadri C.D. Frisbie Appl. Phys. Lett. 78 2001 993
3. M. Nakamura, H. Ohaguri, H. Yanagisawa, N. Goto, N. Ohashi, K. Kudo, in: Proceedings of the International Symposium Super-Functionality Organic Devices IPAP Conference Series, vol. 6, 2005, p. 130.
4. M. Nakamura N. Goto N. Ohashi M. Sakai K. Kudo Appl. Phys. Lett. 86 2005 122112
5. L. Burgi H. Sirringhaus R.H. Friend Appl. Phys. Lett. 80 2002 2913
6. K.P. Puntambekar P.V. Pessavento C.D. Frisbie Appl. Phys. Lett. 83 2003 5539
7. M. Grobosch M. Knupfer Adv. Mater. 19 2007 754
8. Z.T. Zhu J.T. Mason R. Dieckmann G.G. Malliaras Appl. Phys. Lett. 81 2002 4643
9. C.R. Kagan A. Afzali T.Q. Graham Appl. Phys. Lett. 86 2005 193505
10. S. Aramaki Y. Sakai N. Ono Appl. Phys. Lett. 84 2004 2085
11. S. Aramaki Y. Sakai R. Yoshiyama K. Sugiyama N. Ono J. Mizuguchi Proceedings of SPIE 5522 2004 22
12. I. Hill A. Rajagopal A. Kahn Y. Hu Appl. Phys. Lett. 73 1998 662
13. P.B. Shea A.R. Johnson N. Ono J. Kanicki IEEE Trans. Electron Dev. 52 2005 1497
14. P.B. Shea J. Kanicki Y. Cao N. Ono Appl. Phys. Lett. 87 2005 173506