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Physical Review Letters

Volumn 100, Issue 19, 2008, Pages

Thin-thick coexistence behavior of 8CB liquid crystalline films on silicon

(3) Garcia, R a Subashi, E a Fukuto, M b

a Worcester Polytechnic Institute (United States)

b BROOKHAVEN NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT REFLECTION; PHASE SEPARATION; SILICON; SURFACE CHEMISTRY; X RAY OPTICS;

COEXISTENCE BEHAVIOR; LIQUID CRYSTALLINE FILMS; X-RAY REFLECTIVITY MEASUREMENT;

NEMATIC LIQUID CRYSTALS;

EID: 43749114020 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.100.197801 Document Type: Article

Times cited : (16)

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