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European Physical Journal E

Volumn 12, Issue 3, 2003, Pages 361-365

Morphology and structure of thin liquid-crystalline films at nematic-isotropic transition

(2) Ziherl, P a Zumer S b

a UNIVERSITY OF LJUBLJANA (Slovenia)

b JO EF STEFAN INSTITUTE (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

MORPHOLOGY; PHASE TRANSITIONS; SILICON WAFERS; STRUCTURE (COMPOSITION); SURFACE TENSION; THIN FILMS; VAN DER WAALS FORCES; WETTING;

ANCHORING; ANCHORING TRANSITIONS; ISOTROPIC CAPILLARY CONDENSATION; NEMATIC LIQUID CRYSTALLINE FILMS; NEMATIC-ISOTROPIC TRANSITION; PREWETTING TRANSITIONS; SURFACE-INDUCED LAYERING; SURFACE-INDUCED ORDERING; WETTING TRANSITIONS;

NEMATIC LIQUID CRYSTALS;

EID: 1142293222 PISSN: 12928941 EISSN: None Source Type: Journal
DOI: 10.1140/epje/e2004-00002-y Document Type: Article

Times cited : (26)

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