Binary Separation in Very Thin Nematic Films: Thickness and Phase Coexistence

Physical Review Letters

Volumn 87, Issue 12, 2001, Pages

  Van Effenterre, D ^a   Ober, R ^a   Valignat, M P ^a   Cazabat, A M ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; PHASE DIAGRAMS; PHASE SEPARATION; PHASE TRANSITIONS; SILICON; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; X RAY SCATTERING;

ISOTROPIC STATE; THIN NEMATIC FILMS; TRANSITION TEMPERATURE;

NEMATIC LIQUID CRYSTALS;

EID: 39249085019     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.87.125701     Document Type: Article

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