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Volumn 55, Issue 5, 2008, Pages 1250-1254

A new method to extract bulk carrier mobility in germanium-on-insulator

Author keywords

Characterization; Germanium; Germanium on insulator (GeOI); Measurement; Mobility; Pseudo MOSFET; Silicon on insulator (SOI); Unibond

Indexed keywords

CARRIER MOBILITY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY; SUBSTRATES;

EID: 43749090026     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.919301     Document Type: Article
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.