Classification of highly monodisperse nanoparticles of NIST-traceable sizes by TDMA and control of deposition spot size on a surface by electrophoresis

Journal of Aerosol Science

Volumn 39, Issue 6, 2008, Pages 537-548

  Yook, Se Jin ^a   Fissan, Heinz ^b   Engelke, Thomas ^b   Asbach, Christof ^b   van der Zwaag, Till ^b   Kim, Jung Hyeun ^c   Wang, Jing ^d   Pui, David Y H ^d  

^a Hanyang University   (South Korea)

^b Institute of Energy and Environmental Technology (IUTA) eV   (Germany)

^c University of Seoul   (South Korea)

^d University of Minnesota   (United States)

Author keywords

Monodisperse particle generation; NIST traceable particle size; Particle deposition by electrophoresis; Reduction of multiply charged particles; TDMA

Indexed keywords

CALIBRATION; CHARGED PARTICLES; ELECTROPHORESIS; ELECTROSTATICS; PARTICLE SIZE; SEMICONDUCTOR MATERIALS;

DIFFERENTIAL MOBILITY ANALYZER (DMA); MONODISPERSE PARTICLE GENERATION; PARTICLE DEPOSITION; SURFACE INSPECTION;

NANOPARTICLES;

NANOPARTICLE; SILICON DIOXIDE;

CLASSIFICATION; DISPERSION; ELECTROKINESIS; MOBILITY; PARTICLE SIZE; RADIOACTIVITY; SIZE DISTRIBUTION;

AEROSOL; ANALYZER; ARTICLE; CALIBRATION; DENSITY; ELECTROPHORESIS; FRACTIONATION; MATERIALS; PARTICLE SIZE; PRIORITY JOURNAL; SEMICONDUCTOR; SURFACE PROPERTY;

EID: 43649105386     PISSN: 00218502     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jaerosci.2008.03.001     Document Type: Article

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