Large volume metrology process models: A framework for integrating measurement with assembly planning

CIRP Annals - Manufacturing Technology

Volumn 57, Issue 1, 2008, Pages 477-480

  Maropoulos, P G ^a   Guo, Y ^a   Jamshidi, J ^a   Cai, B ^a  

^a University of Bath   (United Kingdom)

Author keywords

Computer automated process planning (CAPP); Measurement planning; Metrology process model

Indexed keywords

ENGINEERING RESEARCH; INFORMATION MANAGEMENT; MATHEMATICAL MODELS; MEASUREMENT THEORY; VERIFICATION;

COMPUTER AUTOMATED PROCESS PLANNING (CAPP); MEASUREMENT PLANNING; METROLOGY PROCESS MODELS;

STRATEGIC PLANNING;

EID: 43649084245     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2008.03.017     Document Type: Article

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