Spectroscopic ellipsometric analysis of interfaces: Comparison of alloy and effective-medium-approximation approaches to a CdMgTe multilayer system

Applied Physics Letters

Volumn 85, Issue 6, 2004, Pages 946-948

  Ghong, T H ^a   Kim, T J ^a   Kim, Y D ^a   Aspnes, D E ^b  

^a Kyung Hee University   (South Korea)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FUNCTIONS; EFFECTIVE-MEDIUM APPROXIMATION (EMA); PARAMETRIC MODELS; SPECTROSCOPIC ELLIPSOMETRY (SE);

CADMIUM ALLOYS; COMPOSITION; DATA REDUCTION; ELLIPSOMETRY; ENERGY GAP; FILM GROWTH; GRAIN BOUNDARIES; MATHEMATICAL MODELS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS; SPECTRUM ANALYSIS; SUBSTRATES;

INTERFACES (MATERIALS);

EID: 4344696225     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1779965     Document Type: Article

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