Double sinusoidal phase modulating laser diode interferometer for thickness measurements of transparent plates

Chinese Optics Letters

Volumn 2, Issue 6, 2004, Pages 328-330

  Li, Dailin ^a   Wang, Xiangzhao ^a   Liu, Yingming ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BESSEL FUNCTIONS; MEASUREMENT ERRORS; PHASE MODULATION; PIEZOELECTRIC TRANSDUCERS; QUARTZ; SEMICONDUCTOR LASERS; THICKNESS MEASUREMENT;

DOUBLE MODULATION TECHNIQUE; DOUBLE SINUSOIDAL PHASE MODULATING; LASER DIODE INTERFEROMETER; LIGHT INTENSITY FLUCTUATIONS; QUARTZ GLASS; TRANSPARENT PLATES;

INTERFEROMETERS;

EID: 4344662561     PISSN: 16717694     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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