Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry

Optics Letters

Volumn 23, Issue 12, 1998, Pages 966-968

  Haruna, Masamitsu ^a   Ohmi, Masato ^a   Mitsuyama, Teruki ^b   Tajiri, Hideyuki ^b   Maruyama, Hideki ^c   Hashimoto, Masahiro ^d  

^a OSAKA UNIVERSITY MEDICAL SCHOOL   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c PANASONIC CORPORATION   (Japan)

^d OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001637005     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.23.000966     Document Type: Article

References (14)

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