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Volumn 31, Issue 6, 2004, Pages 701-704
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Influence of deposition temperature on the properties of ZrO2 films prepared by electron beam evaporation
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Author keywords
Deposition temperature; Electron beam evaporation; Thin film physics; ZrO2 films
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRODEPOSITION;
ELECTRON BEAMS;
OPTICAL PROPERTIES;
RESIDUAL STRESSES;
THIN FILMS;
X RAY DIFFRACTION;
CRYSTALLITE SIZE;
DEPOSITION TEMPERATURE;
ELECTRON BEAM EVAPORATION;
THIN FILM PHYSICS;
ZIRCONIA FILMS;
ZIRCONIA;
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EID: 4344632173
PISSN: 02587025
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (12)
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References (11)
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