DC drift of Z-cut LiNbO 3 modulators

IEEE Photonics Technology Letters

Volumn 16, Issue 7, 2004, Pages 1655-1657

  Nagata, Hirotoshi ^a,b   Feke, Gilbert D ^a   Li, Yagang ^a   Bosenberg, Walter R ^a  

^a JDS UNIPHASE   (United States)

^b IEEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS VOLTAGE; DIRECT CURRENT DRIFT CHARACTERISTICS; RELIABILITY ESTIMATION; TEMPERATURE ACTIVATION ENERGY;

ACTIVATION ENERGY; CAPACITORS; EXTRAPOLATION; INTEGRATED OPTOELECTRONICS; LITHIUM NIOBATE; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; OPTIMIZATION; PARAMETER ESTIMATION; RELIABILITY; VOLTAGE CONTROL;

LIGHT MODULATORS;

EID: 4344624430     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2004.829545     Document Type: Article

References (7)

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